![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Kiev, Ukraine (Thursday 11 May 1995)] International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Cathodoluminescent characteristics and light technical parameters of thin-film screens based on oxides and oxysulfides of rare-earth elements
Bondar, Vyacheslav D., Grytsiv, Myroslav, Groodzinsky, Arkady, Vasyliv, Mykhailo, Svechnikov, Sergey V., Valakh, Mikhail Y.Volume:
2648
Year:
1995
Language:
english
DOI:
10.1117/12.226191
File:
PDF, 120 KB
english, 1995