Research on the Effects of Product Reliability Caused by Coupled Design
Wang, Wei Xing, He, Cheng Ming, Du, Hai DongVolume:
479-481
Language:
english
Journal:
Advanced Materials Research
DOI:
10.4028/www.scientific.net/AMR.479-481.1027
Date:
February, 2012
File:
PDF, 248 KB
english, 2012