Temperature Dependence of Resistance of Conductive Filament Formed by Dielectric Breakdown
Otsuka, Shintaro, Kato, Takashi, Kyomi, Takuya, Hamada, Yoshifumi, Tada, Yoshihiro, Shimizu, Tomohiro, Shingubara, ShosoVolume:
52
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/jjap.52.06gf04
Date:
June, 2013
File:
PDF, 1.02 MB
english, 2013