SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - Burlingame, California, USA (Sunday 3 February 2013)] Stereoscopic Displays and Applications XXIV - A wavelet-based image quality metric for the assessment of 3D synthesized views
Bosc, Emilie, Woods, Andrew J., Holliman, Nicolas S., Battisti, Federica, Carli, Marco, Favalora, Gregg E., Le Callet, PatrickVolume:
8648
Year:
2013
Language:
english
DOI:
10.1117/12.2002410
File:
PDF, 519 KB
english, 2013