SPIE Proceedings [SPIE 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Chengdu, China (Sunday 8 July 2007)] 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Fabrication of ZnO thin film Schottky ultraviolet photodetector
Huang, Bo, He, Guan-nan, Wu, Yue-bo, Zhang, Liang-tang, Li, Jing, Guo, Dong-hui, Wu, Sun-tao, Yang, Li, Chen, Yaolong, Kley, Ernst-Bernhard, Li, RongbinVolume:
6722
Year:
2007
Language:
english
DOI:
10.1117/12.783033
File:
PDF, 342 KB
english, 2007