SPIE Proceedings [SPIE Smart Structures and Materials - San Diego, CA (Sunday 2 March 2003)] Smart Structures and Materials 2003: Smart Sensor Technology and Measurement Systems - Monitoring shape change in compliant structures
Rigg, Euan J., Maier, Robert R. J., Barton, James S., Moore, Andrew J., Jones, Julian D. C., McCulloch, Scott, Wallwork, Andrew, Burnell, Gary, Inaudi, Daniele, Udd, EricVolume:
5050
Year:
2003
Language:
english
DOI:
10.1117/12.484229
File:
PDF, 409 KB
english, 2003