SPIE Proceedings [SPIE SPIE BiOS - San Francisco,...

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SPIE Proceedings [SPIE SPIE BiOS - San Francisco, California, United States (Saturday 7 February 2015)] Design and Quality for Biomedical Technologies VIII - Effective duty cycle of galvanometer-based scanners: impact on OCT imaging

Raghavachari, Ramesh, Liang, Rongguang, Pfefer, T. Joshua, Duma, Virgil-Florin, Tankam, Patrice, Huang, Jinxin, Won, Jungeun, Rolland, Jannick P.
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Volume:
9315
Year:
2015
Language:
english
DOI:
10.1117/12.2079776
File:
PDF, 861 KB
english, 2015
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