SPIE Proceedings [SPIE 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2014) - Harbin, China (Saturday 26 April 2014)] 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Test diffraction properties of reflection waveguide holograms
Zhang, Yudong, Gao, Wei, Xie, Yi, Kang, Ming-Wu, Zhang, Ning, Wang, Bao-PingVolume:
9282
Year:
2014
Language:
english
DOI:
10.1117/12.2069496
File:
PDF, 2.22 MB
english, 2014