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Determination of trace impurities in high-purity aluminium oxide by high resolution inductively coupled plasma mass spectrometry
Kiyoshi Nakane, Yoshinori Uwamino, Hisashi Morikawa, Akira Tsuge, Toshio IshizukaVolume:
369
Year:
1998
Language:
english
Pages:
7
DOI:
10.1016/s0003-2670(98)00240-2
File:
PDF, 138 KB
english, 1998