Statistical characterization of voltage-biased SQUIDs with...

Superconductor Science and Technology 2013 / 06 Vol. 26; Iss. 6

Statistical characterization of voltage-biased SQUIDs with weakly damped junctions

Liu, Chao, Zhang, Yi, Mück, Michael, Zhang, Shulin, Krause, Hans-Joachim, Braginski, Alex I, Zhang, Guofeng, Wang, Yongliang, Kong, Xiangyan, Xie, Xiaoming, Offenhäusser, Andreas, Jiang, Mianheng
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Volume:
26
Language:
english
Journal:
Superconductor Science and Technology
DOI:
10.1088/0953-2048/26/6/065002
Date:
June, 2013
File:
PDF, 1.52 MB
english, 2013
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