SPIE Proceedings [SPIE SPIE LASE - San Francisco, California, United States (Saturday 1 February 2014)] High-Power Diode Laser Technology and Applications XII - Reliability study on high power 638nm broad stripe LD with a window-mirror structure
Zediker, Mark S., Yagi, Tetsuya, Mitsuyama, Hiroshi, Nishida, Takehiro, Kadoiwa, Kaoru, Kuramoto, KyosukeVolume:
8965
Year:
2014
Language:
english
DOI:
10.1117/12.2037110
File:
PDF, 1.20 MB
english, 2014