![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Second International Symposium on Fluctuations and Noise - Maspalomas, Gran Canaria Island, Spain (Tuesday 25 May 2004)] Noise in Devices and Circuits II - Noise in Si/SiGe and Ge/SiGe MODFET
Aniel, Frederic P., Enciso-Aguilar, Mauro, Rodriguez, Manuel, Zerounian, Nicolas, Crozat, Paul, Hackbarth, Thomas, Herzog, Joest-Hans, Danneville, Francois, Bonani, Fabrizio, Deen, M. Jamal, LevinshteVolume:
5470
Year:
2004
Language:
english
DOI:
10.1117/12.546770
File:
PDF, 431 KB
english, 2004