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Increased sensitivity in thick-target particle induced X-ray emission analyses using dry ashing for preconcentration
J.-O. Lill, L. Harju, K.-E. Saarela, A. Lindroos, S.-J. HeseliusVolume:
378
Year:
1999
Language:
english
Pages:
6
DOI:
10.1016/s0003-2670(98)00630-8
File:
PDF, 117 KB
english, 1999