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Dielectric spectroscopy of a thin surface layer by differential time-domain reflectometry using a coplanar waveguide circuit line probe
Shirakashi, R, Ogawa, T, Yamada, JVolume:
24
Language:
english
Journal:
Measurement Science and Technology
DOI:
10.1088/0957-0233/24/2/025501
Date:
February, 2013
File:
PDF, 1.52 MB
english, 2013