An Improvement on the Junction Temperature Measurement of Light-Emitting Diodes by using the Peak Shift Method Compared with the Forward Voltage Method
He, Su-Ming, Luo, Xiang-Dong, Zhang, Bo, Fu, Lei, Cheng, Li-Wen, Wang, Jin-Bin, Lu, WeiVolume:
29
Language:
english
Journal:
Chinese Physics Letters
DOI:
10.1088/0256-307X/29/12/127802
Date:
December, 2012
File:
PDF, 1.66 MB
english, 2012