SPIE Proceedings [SPIE International Symposium on Precision Engineering Measurement and Instrumentation - Changsha/Zhangjiajie, China (Friday 8 August 2014)] Ninth International Symposium on Precision Engineering Measurement and Instrumentation - A high-resolution detecting system based on machine vision for defects on large aperture and super-smooth surface
Cui, Junning, Tan, Jiubin, Wen, Xianfang, Yang, Yongying, Zhao, Limin, Wang, Shitong, Cao, Pin, Liu, Dong, Li, Lu, Yan, Lu, Li, Chen, Xie, Shibing, Li, Yang, Chen, YangjieVolume:
9446
Year:
2015
Language:
english
DOI:
10.1117/12.2181182
File:
PDF, 459 KB
english, 2015