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SPIE Proceedings [SPIE SPIE Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring - San Diego, California, USA (Sunday 9 March 2014)] Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2014 - In situ phase change characterization of PVDF thin films using Raman spectroscopy
Lynch, Jerome P., Wang, Kon-Well, Sohn, Hoon, Riosbaas, Miranda T., Loh, Kenneth J., O'Bryan, Greg, Loyola, Bryan R.Volume:
9061
Year:
2014
Language:
english
DOI:
10.1117/12.2045430
File:
PDF, 777 KB
english, 2014