Characterization of Metal/Ferroelectric/Insulator/Semiconductor Structure with $\bf CeO_{2}$ Buffer Layer
Hirai, Tadahiko, KazuhiroTeramoto,, Nagashima, Kazuhito, Koike, Hiroshi, Tarui, YasuoVolume:
34
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.34.4163
Date:
August, 1995
File:
PDF, 1.10 MB
english, 1995