Submicron scale image observation with a grazing incidence reflection-type single-shot soft X-ray microscope
Baba, Motoyoshi, Nishikino, Masaharu, Hasegawa, Noboru, Tomita, Takuro, Minami, Yasuo, Takei, Ryota, Yamagiwa, Mitsuru, Kawachi, Tetsuya, Suemoto, TohruVolume:
53
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.53.080302
Date:
August, 2014
File:
PDF, 266 KB
english, 2014