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SPIE Proceedings [SPIE Aerospace/Defense Sensing and Controls - Orlando, FL (Monday 8 April 1996)] Technologies for Synthetic Environments: Hardware-in-the-Loop Testing - High-fidelity phenomenology modeling of infrared emissions from missile and aircraft exhaust plumes

Crow, Dennis R., Coker, Charles F., Murrer, Jr., Robert Lee
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Volume:
2741
Year:
1996
Language:
english
DOI:
10.1117/12.241101
File:
PDF, 858 KB
english, 1996
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