SPIE Proceedings [SPIE 4th International Conference on Thin Film Physics and Applications - Shanghai, China (Monday 8 May 2000)] Fourth International Conference on Thin Film Physics and Applications - Effect of structure development on self-trapped exciton emission of TiO2 thin films
Sildos, Ilmo, Suisalu, A., Kiisk, V., Schuisky, M., Mandar, H., Uustare, T., Aarik, Jaan, Chu, Junhao, Liu, Pulin, Chang, YongVolume:
4086
Year:
2000
Language:
english
DOI:
10.1117/12.408489
File:
PDF, 164 KB
english, 2000