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Experimental Study for Cement Microscopic Property by Backscatter Scanning Technique
Ye, Tao, Jiang, Bin, Ye, Xian XianVolume:
476-478
Language:
english
Journal:
Advanced Materials Research
DOI:
10.4028/www.scientific.net/AMR.476-478.1581
Date:
February, 2012
File:
PDF, 263 KB
english, 2012