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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] Advances in X-Ray/EUV Optics and Components IX - Simulations and surface quality testing of high asymmetry angle x-ray crystal monochromators for advanced x-ray imaging applications
Morawe, Christian, Khounsary, Ali M., Goto, Shunji, Zápražný, Z., Korytár, D., Šiffalovič, P., Jergel, M., Demydenko, M., Mikulík, P., Dobročka, E., Ferrari, C., Vagovič, P., Mikloška, M.Volume:
9207
Year:
2014
Language:
english
DOI:
10.1117/12.2061353
File:
PDF, 3.15 MB
english, 2014