[ECS 216th ECS Meeting - Vienna, Austria (October 4 - October 9, 2009)] ECS Transactions - In-Situ Investigation of SOFC Patterned Electrodes using Ambient-Pressure X-ray Photoelectron Spectroscopy
McDaniel, Anthony, El Gabaly, Farid, Akhadov, E., Farrow, Roger L., McCarty, Kevin F., Linne, Mark A., Decaluwe, Steven C., Zhang, Chunjuan, Eichhorn, B., Jackson, Gregory S., Liu, Zhi, Grass, MichaelYear:
2009
Language:
english
DOI:
10.1149/1.3205541
File:
PDF, 1.70 MB
english, 2009