[IEEE NAECON 2014 - IEEE National Aerospace and Electronics Conference - Dayton, OH, USA (2014.6.24-2014.6.27)] NAECON 2014 - IEEE National Aerospace and Electronics Conference - An image matching method based on the analysis of grey correlation degree and feature points
Ding, Zishuo, Qian, Shuo, Li, Yulin, Li, ZhaohuiYear:
2014
Language:
english
DOI:
10.1109/NAECON.2014.7045795
File:
PDF, 1.83 MB
english, 2014