SPIE Proceedings [SPIE SPIE BiOS - San Francisco, California, United States (Saturday 1 February 2014)] Optical Diagnostics and Sensing XIV: Toward Point-of-Care Diagnostics - Fluorescent imaging over an ultra-large field-of-view of 532 cm 2 using a flatbed scanner
Coté, Gerard L., Göröcs, Zoltán S., Ling, Yuye, Yu, Meng D., Karahalios, Dimitri, Mogharabi, Kian, Lu, Kenny, Wei, Qingshan, Ozcan, AydoganVolume:
8951
Year:
2014
Language:
english
DOI:
10.1117/12.2038602
File:
PDF, 887 KB
english, 2014