SPIE Proceedings [SPIE SPIE Sensing Technology + Applications - Baltimore, Maryland, USA (Monday 5 May 2014)] Terahertz Physics, Devices, and Systems VIII: Advanced Applications in Industry and Defense - Radar cross section measurements of frequency selective terahertz retroreflectors
Anwar, Mehdi F., Crowe, Thomas W., Manzur, Tariq, Williams, Richard J., Gatesman, Andrew J., Goyette, Thomas M., Giles, Robert H.Volume:
9102
Year:
2014
Language:
english
DOI:
10.1117/12.2051802
File:
PDF, 1.07 MB
english, 2014