SPIE Proceedings [SPIE OPTO - San Francisco, California (Saturday 23 January 2010)] Gallium Nitride Materials and Devices V - First-principles simulation of GaN material and devices: an application to GaN APDs
Bellotti, Enrico, Moresco, Michele, Bertazzi, Francesco, Chyi, Jen-Inn, Nanishi, Yasushi, Morkoç, Hadis, Litton, Cole W., Piprek, Joachim, Yoon, EuijoonVolume:
7602
Year:
2010
Language:
english
DOI:
10.1117/12.842088
File:
PDF, 591 KB
english, 2010