Characterization of Talbot pattern illumination for...

Optical Engineering 2013 / 03 Vol. 52; Iss. 9

Characterization of Talbot pattern illumination for scanning optical microscopy

Liu, Guangshuo, Yang, Changhuei, Wu, Jigang
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Volume:
52
Language:
english
Journal:
Optical Engineering
DOI:
10.1117/1.OE.52.9.091714
Date:
March, 2013
File:
PDF, 1.85 MB
english, 2013
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