Determination of thin-film parameters from high accuracy...

Metrologia 2003 / 02 Vol. 40; Iss. 1

Determination of thin-film parameters from high accuracy measurements of spectral regular transmittance

Nevas, S, Manoocheri, F, Ikonen, E
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Volume:
40
Language:
english
Journal:
Metrologia
DOI:
10.1088/0026-1394/40/1/346
Date:
February, 2003
File:
PDF, 1.16 MB
english, 2003
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