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X-ray reflectivity and atomic force microscopy studies of MOCVD grown Al x Ga 1− x N/GaN superlattice structures
Wang, Yuanzhang, Li, Jinchai, Li, Shuping, Chen, Hangyang, Liu, Dayi, Kang, JunyongVolume:
32
Language:
english
Journal:
Journal of Semiconductors
DOI:
10.1088/1674-4926/32/4/043006
Date:
April, 2011
File:
PDF, 207 KB
english, 2011