Diamond layout style impact on SOI MOSFET in high...

Microelectronics Reliability 2015 / 04 Vol. 55; Iss. 5

Diamond layout style impact on SOI MOSFET in high temperature environment

Gimenez, Salvador Pinillos, Galembeck, Egon Henrique Salerno, Renaux, Christian, Flandre, Denis
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Volume:
55
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2015.02.015
Date:
April, 2015
File:
PDF, 659 KB
english, 2015
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