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SPIE Proceedings [SPIE Defense and Security - Orlando, FL (Monday 28 March 2005)] Biometric Technology for Human Identification II - Hand-geometry recognition based on contour parameters

Veldhuis, Raymond N., Bazen, Asker M., Booij, Wim D., Hendrikse, Anne J., Jain, Anil K., Ratha, Nalini K.
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Volume:
5779
Year:
2005
Language:
english
DOI:
10.1117/12.602683
File:
PDF, 531 KB
english, 2005
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