On-Line Defect Detecting Method Based on Kernel Method
Xu, Ke Jia, Chen, Bin, Zeng, LiVolume:
474-476
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.474-476.858
Date:
April, 2011
File:
PDF, 325 KB
english, 2011