SPIE Proceedings [SPIE SPECKLE 2012: V International...

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SPIE Proceedings [SPIE SPECKLE 2012: V International Conference on Speckle Metrology - Vigo, Spain (Monday 10 September 2012)] Speckle 2012: V International Conference on Speckle Metrology - Material characterization by laser speckle photometry

Bendjus, Beatrice, Cikalova, Ulana, Schreiber, Juergen, Doval, Ángel F., Trillo, Cristina
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Volume:
8413
Year:
2012
Language:
english
DOI:
10.1117/12.978246
File:
PDF, 3.78 MB
english, 2012
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