SPIE Proceedings [SPIE SPECKLE 2012: V International...

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SPIE Proceedings [SPIE SPECKLE 2012: V International Conference on Speckle Metrology - Vigo, Spain (Monday 10 September 2012)] Speckle 2012: V International Conference on Speckle Metrology - Laser speckle photometry: contactless nondestructive testing technique

Cikalova, Ulana, Nicolai, Juergen, Bendjus, Beatrice, Schreiber, Juergen, Doval, Ángel F., Trillo, Cristina
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Volume:
8413
Year:
2012
Language:
english
DOI:
10.1117/12.978247
File:
PDF, 869 KB
english, 2012
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