Determining the Complete Residual Stress Tensors in SOS...

Key Engineering Materials 2010 / 6 Vol. 443

Determining the Complete Residual Stress Tensors in SOS Hetero-Epitaxial Thin Film Systems by the Technique of X-Ray Diffraction

Liu, Mei, Zhang, Liang Chi, Brawley, Andrew, Atanackovic, Petar, Duvall, Steven
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Volume:
443
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.443.742
Date:
June, 2010
File:
PDF, 338 KB
english, 2010
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