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Importance of frequency-dependent grain boundary scattering in nanocrystalline silicon and silicon–germanium thermoelectrics
Hua, Chengyun, Minnich, Austin JVolume:
29
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/29/12/124004
Date:
December, 2014
File:
PDF, 195 KB
english, 2014