SPIE Proceedings [SPIE Biomedical Optics (BiOS) 2008 - San Jose, CA (Saturday 19 January 2008)] Advanced Biomedical and Clinical Diagnostic Systems VI - Surface shape parameters and analysis of data captured with use of 4D surface scanners
Witkowski, Marcin, Sitnik, Robert, Rapp, Walter, Haex, Bart, Kowalski, Marcin, Mooshake, Sven, Vo-Dinh, Tuan, Grundfest, Warren S., Benaron, David A., Cohn, Gerald E.Volume:
6848
Year:
2008
Language:
english
DOI:
10.1117/12.763987
File:
PDF, 1.86 MB
english, 2008