Characterizing Alpha- and Neutron-Induced SEU and MCU on...

IEEE Transactions on Nuclear Science 2015 / 4 Vol. 62; Iss. 2

Characterizing Alpha- and Neutron-Induced SEU and MCU on SOTB and Bulk 0.4-V SRAMs

Hirokawa, Soichi, Harada, Ryo, Hashimoto, Masanori, Onoye, Takao
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Volume:
62
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2015.2403265
Date:
April, 2015
File:
PDF, 1003 KB
english, 2015
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