SPIE Proceedings [SPIE NDE for Health Monitoring and Diagnostics - San Diego, CA (Sunday 2 March 2003)] Nondestructive Evaluation and Health Monitoring of Aerospace Materials and Composites II - Application of wavelet analysis in two-dimensional ultrasonic flaw detection
Achanta, Anjani R., Rao, Vittal, Gyekenyesi, Andrew L., Shull, Peter J.Volume:
5046
Year:
2003
Language:
english
DOI:
10.1117/12.484777
File:
PDF, 234 KB
english, 2003