Unsupervised image processing scheme for transistor photon...

Journal of Electronic Imaging 2015 / 01 Vol. 24; Iss. 1

Unsupervised image processing scheme for transistor photon emission analysis in order to identify defect location

Chef, Samuel, Jacquir, Sabir, Sanchez, Kevin, Perdu, Philippe, Binczak, Stéphane
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Volume:
24
Language:
english
Journal:
Journal of Electronic Imaging
DOI:
10.1117/1.JEI.24.1.013019
Date:
January, 2015
File:
PDF, 5.49 MB
english, 2015
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