Identification of pore size in porous SiO 2...

Chinese Physics C 2009 / 02 Vol. 33; Iss. 2

Identification of pore size in porous SiO 2 thin film by positron annihilation

Zhe, Zhang, Xiu-Bo, Qin, Dan-Ni, Wang, Run-Sheng, Yu, Qiao-Zhan, Wang, Yan-Yun, Ma, Bao-Yi, Wang
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Volume:
33
Language:
english
Journal:
Chinese Physics C
DOI:
10.1088/1674-1137/33/2/015
Date:
February, 2009
File:
PDF, 813 KB
english, 2009
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