SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Interferometry XII: Techniques and Analysis - Deformation measurement based on digital holography
Lu, Zhiwen, Yu, Yingjie, Jiao, Yunfang, Creath, Katherine, Schmit, JoannaVolume:
5531
Year:
2004
Language:
english
DOI:
10.1117/12.555954
File:
PDF, 505 KB
english, 2004