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SPIE Proceedings [SPIE Photonics North 2006 - Quebec City, Canada (Monday 19 June 2006)] Photonics North 2006 - Surface inspection of hard to reach industrial parts using low-coherence interferometry
Dufour, M. L., Lamouche, G., Vergnole, S., Gauthier, B., Padioleau, C., Hewko, M., Lévesque, S., Bartulovic, V., Mathieu, PierreVolume:
6343
Year:
2006
Language:
english
DOI:
10.1117/12.707806
File:
PDF, 729 KB
english, 2006