Reducing vulnerability to soft errors in sub-100 nm content...

Journal of Semiconductors 2010 / 02 Vol. 31; Iss. 2

Reducing vulnerability to soft errors in sub-100 nm content addressable memory circuits

Yan, Sun, Jiaxing, Zhang, Minxuan, Zhang, Yue, Hao
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Volume:
31
Language:
english
Journal:
Journal of Semiconductors
DOI:
10.1088/1674-4926/31/2/025013
Date:
February, 2010
File:
PDF, 156 KB
english, 2010
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