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SPIE Proceedings [SPIE Electronic Imaging - San Jose, CA (Saturday 22 January 2000)] Machine Vision Applications in Industrial Inspection VIII - Eggshell defects detection based on color processing
Garcia-Alegre, Maria C., Ribeiro, Angela, Guinea, Domingo, Cristobal, Gabriel, Tobin, Jr., Kenneth W.Volume:
3966
Year:
2000
Language:
english
DOI:
10.1117/12.380082
File:
PDF, 2.57 MB
english, 2000