Atomic and electronic structure peculiarities of silicon wires formed on substrates with varied resistivity according to ultrasoft X-ray emission spectroscopy
Turishchev, S. Yu., Terekhov, V. A., Nesterov, D. N., Koltygina, K. G., Sivakov, V. A., Domashevskaya, E. P.Volume:
41
Language:
english
Journal:
Technical Physics Letters
DOI:
10.1134/S106378501504015X
Date:
April, 2015
File:
PDF, 1.08 MB
english, 2015