Dislocation and Elastic Strain in an InN Film Characterized by Synchrotron Radiation X-Ray Diffraction and Rutherford Backscattering/Channeling
Cheng, Feng-Feng, Fa, Tao, Wang, Xin-Qiang, Yao, Shu-DeVolume:
29
Language:
english
Journal:
Chinese Physics Letters
DOI:
10.1088/0256-307X/29/2/026101
Date:
February, 2012
File:
PDF, 300 KB
english, 2012