SPIE Proceedings [SPIE SPIE LASE - San Francisco, California, USA (Saturday 21 January 2012)] Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XVII - Laser-induced transient stress distribution inside a single crystal by time-resolved birefringence imaging
Tochio, Takaya, Sakakura, Masaaki, Kanehira, Shingo, Shimotsuma, Yasuhiko, Miura, Kiyotaka, Hirao, Kazuyuki, Hennig, Guido, Xu, Xianfan, Gu, Bo, Nakata, YoshikiVolume:
8243
Year:
2012
Language:
english
DOI:
10.1117/12.908186
File:
PDF, 11.07 MB
english, 2012